Self-diffraction effect observation and recording the holographic one-dimensional and two-dimensional gratings in thin photosensitive films

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dc.contributor.authorAgeev, L.A.
dc.contributor.authorBeloshenko, K.S.
dc.contributor.authorMakovetsky, E.D.
dc.contributor.authorMiloslavsky, V.K.
dc.date.accessioned2012-11-21T11:24:25Z
dc.date.available2012-11-21T11:24:25Z
dc.date.issued2007
dc.description.abstractA setup for observation of the nonlinear self-diffraction effect has been described. A semiconductor laser (P approximately 50mW, wavelength approximately 660nm) is used as a radiation source. The laser beam is divided into two beams by a Wollaston prism, the beams pass through a polarizer and positive lens, then they intersect and create an interference. Using a microscope, the interference may be observed in an increased scale on a remote screen. The interference is registered in a thin photosensitive As2S3-Ag film prepared by vacuum evaporation. We have shown an opportunity to observe the self-diffraction from recorded diffraction grating with linear grooves and from two-dimensional grating induced as a result of second exposure after turning the convergence plane of the interfering beams by 90 degrees.en
dc.identifier.citationFunct. Mater., 2007, Vol. 14, № 3, pp.290-294.en
dc.identifier.issn1027-5495
dc.identifier.urihttps://ekhnuir.karazin.ua/handle/123456789/7091
dc.language.isoenen
dc.publisherInstitute for Single Crystalsen
dc.subjectоптикаen
dc.subjectкафедра физической оптикиen
dc.subjectсамодифракцияen
dc.subjectдифракционная решеткаen
dc.subjectголографияen
dc.subjectлазерen
dc.subjectтонкая пленкаen
dc.subjectСульфид мышьякаen
dc.titleSelf-diffraction effect observation and recording the holographic one-dimensional and two-dimensional gratings in thin photosensitive filmsen
dc.typeArticleen

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