Підвищення метрологічних та експлуатаційних характеристик елементів та систем атомно-емісійного спектрального аналізу

Abstract

Yegorov V. A. Improving metrological and operational characteristics of elements and systems of atomic emission spectral analysis. – Manuscript. Thesis for Candidate Degree in Physical and Мathematical Sciences, Speciality 01.04.01 – Physics of Devices, Elements and Systems. – O. Ya. Usikov Institute for Radiophysics and Electronics, National Academy of Sciences of Ukraine; V. N. Karazin Kharkiv National University, Ministry of Education and Science of Ukraine, Kharkiv, 2020. The dissertation is devoted to solving the problem of identifying the physical laws of the processes of excitation, analysis and registration of the spectra of arc and spark plasma formations in the equipment for atomic emission spectral analysis, and the use of these laws to improve the metrological and operational characteristics of analytical equipment. The development and creation of a complex of equipment for atomic emission spectral analysis, research and implementation of methods for improving their metrological and operational characteristics have been completed.