About One Model of Consecutive Qubit Binary Testing

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dc.contributor.authorThawi, M.
dc.contributor.authorZholtkevych, G.
dc.date.accessioned2010-06-01T10:50:59Z
dc.date.available2010-06-01T10:50:59Z
dc.date.issued2010
dc.description.abstractQubit binary tests models are considered in the paper. For each binary test the state of compound quantum-classical system is associated. Formulas for density matrices transformation under binary test are obtained. Method for computing probabilistic characteristics of testing outcomes is proposed. Class of probabilistic measures on testing outcome sequences space is described.
dc.identifier.citationBulletin of V. Karazin Kharkiv National University, – 2010. – № 890. Series «Mathimatical Modeling. Information Technology. Automated Control Systems», Issue 13. – P. 71-81
dc.identifier.urihttps://ekhnuir.karazin.ua/handle/123456789/1109
dc.language.isoen
dc.publisherV. Karazin Kharkiv National University
dc.subjectqubit
dc.subjectquantum measurement
dc.subjectprojective measurement
dc.subjectconsecutive quantum measurement
dc.titleAbout One Model of Consecutive Qubit Binary Testing
dc.typeArticle

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